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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
11989An Efficient Layer Assignment for Three-Layer Restrictive VLSI RoutingChang, K. E.; Fang, S. C.; 馮武雄; Feng, Wu-ShiungProceedings of Electron Devices and Materials Symposium 
21982GaInAsP-InP Double Heterostructure Lasers Emitting at 1.3μmYang, Seng-JennProceedings of Electronic Devices and Materials Symposium 
31993Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer胡振國 ; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo ; Wu, Z. Y.Proceedings of Electronic Devices and Materials Symposium 
41986Radiation Effects on the Oxide Properties of Silicon MOS Capacitor胡振國 ; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔 ; Hwu, Jenn-Gwo ; Lee, G. S.; Jeng, M. J.; Wang, Way-Seen; Lee, Si-Chen Electronic Devices and Materials Symposium 
51989Reliable C-V Characterization of MOS Capacitors by Initial Treatment at the Presence of Slow Interface States胡振國 ; Lin, J. J.; 王維新; Hwu, Jenn-Gwo ; Wang, Way-SeenProceedings of Electronic Devices and Materials Symposium 
61987A Testing Tool Based on LSSDLee, K.; Chang, C.; 林呈祥; Lin, Chen-ShangElectron Devices and Materials Symposium