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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
11989Minority-Carrier Lifetime Measurement Using an Al/SiO2/p-Si MOS Capacitor林浩雄 ; Jih, H. J.; Lin, Hao-Hsiung ; Jih, H. J.15th EDMS 
21989Two-Dimensional Simulation on the Electric Field Distribution of Indium Antimonide (InSb) Charge Injection Devices (CID's)Wu, C. W.; 林浩雄 ; Lin, Hao-Hsiung 15th EDMS