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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12009Heuristic algorithm for the resource-constrained scheduling problem during high-level synthesisY.-H. Wu; C.-J. Yu; S.-D. Wang; SHENG-DE WANG IET Computers & Digital Techniques 55
22011Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chipsW.C. Wang; J.C.M Li; CHIEN-MO LI IET Computers & Digital Techniques 22
32008Simultaneous capture and shift power reduction test pattern generator for scan testingLin, H.-T.; Li, J.C.-M.IET Computers & Digital Techniques 
42008Simultaneous capture and shift power reduction test pattern generator for scan testingH.T. Lin; J. C.M. Li; CHIEN-MO LI IET Computers & Digital Techniques 1012
52009Time-space test response compaction and diagnosis based on BCH codesF. M. Wang; W.-C. Wang; J. C-M. Li; CHIEN-MO LI IET Computers & Digital Techniques 00