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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12006A fast in situ approach to estimating wafer warpage profile during thermal processing in microlithographyNi Hu; Arthur Tay; Kuen-Yu Tsai; KUEN-YU TSAI Measurement Science and Technology 41
22001A plastic-fibre-bundle-based transducer array for mapping and detection of the end point for dissolution of a photoresistLin, G.-R.; Horng, J.S.; GONG-RU LIN Measurement Science and Technology 00
32016Finite element analysis and equivalent parallel-resistance model for conductive multilayer thin filmsChen, Yu-Yi; Juang, Jia-Yang; JIA-YANG JUANG Measurement Science and Technology 1214
42013Impedimetric sensing of the ethanol and water contents in gasohol with a flow-through carbon electrode pairRICHIE CHEN Measurement Science and Technology 56
52008Multiple disturbances classifier for electric signals using adaptive structuring neural networksLu, Yen-Ling; JOE-AIR JIANG ; Chuang, Cheng-Long; Fahn, Chin-Shyurng; Jiang, Joe-Air Measurement Science and Technology 174
62016Out-of-focus effects on microscale schlieren measurements of mass transport in a microfluidic deviceCHEN-LI SUN; CHEN-LI SUN Measurement Science and Technology 00