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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12014Effect of focued ion beam imaging process on the crystallinity of InAsT. H. Huang; W. C. Chen; K. C. Chen; H. H. Lin; HAO-HSIUNG LIN IEDMS 2014, international electron devices and materials symposium 
22014Study of twin defects in (111)B GaAsSb by X-ray diffractionS. C. Chen,; Y. H. Lin,; H. H. Lin,; HAO-HSIUNG LIN IEDMS 2014, international electron devices and materials symposium