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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12014Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM TestingB.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI IEEE International Test Conference 
22014Divide and Conquer Diagnosis for Multiple DefectsSM Chao; PJ Chen; JCM Li; CHIEN-MO LI IEEE International Test Conference 00
32006Jump Simulation: A Fast and Precise Scan Chain Diagnosis TechniqueY. L Kao; W. S. Chuang; J. C. M Li; CHIEN-MO LI IEEE International Test Conference 310