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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12013Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic FunctionsShin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong Rol Jiang; Chien-Mo Li; CHIEN-MO LI Int’l Conf. on CAD 10