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Issue DateTitleAuthor(s)TypescopusWOSFulltext/Archive link
12013Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAMCHIEN-MO LI conference paper20
22007Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction TechniqueCHIEN-MO LI conference paper00
32013Test Generation of Path Delay Faults Induced by Defects in Power TSVCHIEN-MO LI conference paper10