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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12008A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effectsKuen-Yu Tsai; Meng-Fu You; Yi-Chang Lu; Philip C. W. Ng; YI-CHANG LU ; KUEN-YU TSAI ICCAD 2008, IEEE/ACM International Conference on Computer-Aided Design 80