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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12008A Built-In TFT Array Charge-Sensing Technique for System-on-Panel DisplaysC.-W. Lin; Jiun-Lang Huang; JIUN-LANG HUANG VLSI Test Symposium 110
22007A Low Cost Spectral Power Extraction Technique for RF Transceiver TestingT.-L. Hung; J.-L. Huang; JIUN-LANG HUANG VLSI Test Symposium 20
32006A period tracking based on-chip sinusoidal jitter extraction techniqueC.-Y. Kuo; J.-L. Huang; JIUN-LANG HUANG VLSI Test Symposium 60
42012A SAR ADC missing-decision level detection and removal techniqueX.-L. Huang; J.-L. Huang; Y.-F. Chou; D.-M. Kwai; JIUN-LANG HUANG VLSI Test Symposium 00
52010An ADC/DAC Loopback Testing Methodology by DAC Output Offsetting and ScalingXuan-Lun Huang; Jiun-Lang Huang; JIUN-LANG HUANG VLSI Test Symposium 80
62011Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICsW.-A. Lin; C.-C. Li; J.-L. Huang; JIUN-LANG HUANG VLSI Test Symposium 10