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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12006Conductive atomic force microscopy application for semiconductor failure analysis in advanced nanometer processLin, K.; Zhang, H.; Lu, S.-S.; SHEY-SHI LU International Symposium for Testing and Failure Analysis 
22005Scanning Capacitance Microscopy application for bipolar and CMOS doping issues in semiconductor failure analysisSHEY-SHI LU Conference Proceedings from the International Symposium for Testing and Failure Analysis