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Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
12004An Efficient Perfect Algorithm for Memory Repair ProblemsH. Y. Lin; I. Y. Chen; F. M. Yeh; S. Y. Kuo; SY-YEN KUO 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04) 80
22004An XOR-based Reed-Solomon Algorithm for Advanced RAID SystemsP. H. Hsieh; I. Y. Chen; Y. T. Lin; S. Y. Kuo; SY-YEN KUO 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04) 130
32004IC HTOL Test Stress Condition OptimizationPeng, Brian; Chen, Ing-Yi; Kuo, Sy-Yen; Bolger, Colin; SY-YEN KUO 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04) 70