Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
.National Taiwan University / 國立臺灣大學
Project / 研究計畫
精進剖面掃描探測技術探討新穎奈米材料的異質結構介面特性(3/3)
精進剖面掃描探測技術探討新穎奈米材料的異質結構介面特性(3/3)
Details
Primary Data
Project title
精進剖面掃描探測技術探討新穎奈米材料的異質結構介面特性(3/3)
Internal ID
103-2112-M-002-028-MY3
Principal Investigator
YA-PING CHIU
Start Date
August 1, 2016
End Date
July 31, 2017
Partner Organizations
National Science and Technology Council
Description
Keywords
氮化鎵
電子結構
異質介面
載子傳輸
掃描穿隧式顯微
GaN
electronic structure
heterojunctions
carrier transport
scanning tunneling microscopy (STM)