奈米矽晶薄膜於光、電、機械應力下可靠度與穩定性之研究

Project title

Internal ID

96-2218-E-002-032-

Principal Investigator

Start Date

August 1, 2007

End Date

July 31, 2008

Partner Organizations

Keywords

奈米矽晶

結晶度

穩定度

定光電流量測

吸收光譜

nanocrystalline silicon

crystal volume fraction

stability

constant photocurrent measurement

absorption spectrum