考量次10奈米製程下可延展性與可靠性之系統晶片驗證技術

Project title

考量次10奈米製程下可延展性與可靠性之系統晶片驗證技術

Internal ID

103-2221-E-002-272-MY3

Principal Investigator

CHUNG-YANG HUANG

Start Date

August 1, 2016

End Date

July 31, 2017

Partner Organizations

National Science and Technology Council