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.National Taiwan University / 國立臺灣大學
Project / 研究計畫
利用掃瞄探針顯微術及相關技術研究超薄分子薄膜的結構性質關連(2/2)
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利用掃瞄探針顯微術及相關技術研究超薄分子薄膜的結構性質關連(2/2)
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Primary Data
Project title
利用掃瞄探針顯微術及相關技術研究超薄分子薄膜的結構性質關連(2/2)
Internal ID
94-2112-M-002-012-
Principal Investigator
WOEI-WU PAI
Start Date
August 1, 2005
End Date
July 31, 2006
Partner Organizations
National Science and Technology Council