Project title
應用非破壞性檢測薄層材料系統之特性與實驗量測
Internal ID
93-2218-E-002-057-
Principal Investigator
Start Date
August 1, 2004
End Date
July 31, 2005
Partner Organizations
應用非破壞性檢測薄層材料系統之特性與實驗量測
Keywords
非破壞檢測
薄層系統
振幅頻譜法
Nondestructive Testing
Thin-layer System
Amplitude Spectrum Technique