Imaging of Recording Marks and Their Jitters With Different Writing Strategy and Terminal Resistance of Optical Output
Resource
IEEE Transactions on Magnetics, 45(5), 2221-2223
Journal
IEEE Transactions on Magnetics
Pages
2221-2223
Date Issued
2009
Date
2009
Author(s)
Chu, C. H.
Wu, B. J.
Kao, T. S.
Fu, Y. H.
Chiang, H. P.
Tsai, D. P.
Abstract
The relation between recording mark formation and jitter value with radial orient spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.
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