The dependence of the performance of strained NMOSFETs on channel width

Journal

IEEE Transactions on Electron Devices

Journal Volume

56

Journal Issue

11

Pages

2848-2852

Date Issued

2009

Author(s)

Yeh, L.

Chen, C.H.

Wu, J.

Lee, J.Y.-M.

Liu, C.W.

Lee, T.L.

DOI

10.1109/TED.2009.2030542

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-70350743205&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/350474

Type

journal article