Effect of Fabrication Parameters on Three-Dimensional Nanostructures of Bulk Heterojunctions Imaged by High-Resolution Scanning ToF-SIMS

Resource
ACS Nano, 4(2), 833-840
Journal
ACS Nano
Pages
833-840
Date Issued
2010
Date
2010
Author(s)
Yu, Bang-Ying
Lin, Wei-Chun
Wang, Wei-Ben
Iida, Shin-ichi
Chen, Sun-Zen
Liu, Chia-Yi
Kuo, Che-Hung
Lee, Szu-Hsian
Kao, Wei-Lun
Yen, Guo-Ji
You, Yun-Wen
Liu, Chi-Ping
Jou, Jwo-Huei
Shyue, Jing-Jong
DOI
URI
Type
journal article
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To permanently archive and promote researcher profiles and scholarly works, Library integrates the services of “NTU Repository” with “Academic Hub” to form NTU Scholars.

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