Computing System Failure Frequencies and Reliability Importance Measures using OBDD

Resource

IEEE Transactions on Computers 53 (1): 54-68

Journal

IEEE Transactions on Computers

Journal Volume

53

Journal Issue

1

Pages

54-68

Date Issued

2004

Date

2004

Author(s)

Chang, Yung-Ruei

Amari, S.V.

Kuo, Sy-Yen

URI

Type

journal article

File(s)

Name

17.pdf

Size

2.04 MB

Format

Adobe PDF

Checksum

(MD5):e651b79b6c50e1321c02dd50ff5b9df7