An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration
Journal
Journal of Electronic Testing: Theory and Applications
Journal Volume
28
Journal Issue
5
Pages
705-722
Date Issued
2012-10
Author(s)
X.-L. Huang
J.-L. Huang
H.-I. Chen
C.-Y. Chen
K.-T. Tseng
M.-F. Huang
Y.-F. Chou
D.-M. Kwai
Type
journal article