Thermal-Aware Test Frequency Optimization

Part Of

Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia

Journal Volume

7

Start Page

1

End Page

5

ISBN (of the container)

979-833154033-3

Date Issued

2024-08-18

Author(s)

Wei-Shen Wang

Zhe-Jia Liang

Norman Chang

Akhilesh Kumar

Ying-Shiun Li

DOI

URI

Event(s)

8th IEEE International Test Conference in Asia, ITC-Asia 2024

Publisher

IEEE

Type

conference paper