Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems
Journal
IEEE Microwave and Wireless Components Letters
Journal Volume
33
Journal Issue
2
Date Issued
2022-01-01
Author(s)
Abstract
A theory of arrangements of measurements for obtaining the scattering matrix of a $v$ -port circuit using a $k$ -port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter provide a general strategy for reducing the number of multiport measurements of microwave circuits.
Subjects
Covering design | covering number | design of experiments (DOE) | Impedance | Impedance measurement | Microwave circuits | Microwave measurement | multiport measurement | Scattering | scattering matrix | scattering parameter | Scattering parameters | Turán number | Turán system | vector network analyzer (VNA) | Wireless communication
Type
journal article