Test pattern compression for probabilistic circuits

Journal

Proceedings of the Asian Test Symposium

Pages

19-23

Date Issued

2018

Author(s)

Chang, C.-M.

Yang, K.-J.

Li, J.C.-M.

DOI

10.1109/ATS.2017.17

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505968

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85045185939&doi=10.1109%2fATS.2017.17&partnerID=40&md5=f6458f895cd990d0338aa7c2dd081624

Type

conference paper