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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Mobility strain response and low temperature characterization of Ge p-MOSFETs
Details
Mobility strain response and low temperature characterization of Ge p-MOSFETs
Journal
Device Research Conference, DRC
Pages
73-74
Date Issued
2013
Author(s)
CHEE-WEE LIU
Wong, I.-H.
Chen, Y.-T.
Ciou, H.-J.
Chen, Y.-S.
Yan, J.-Y.
CHEE-WEE LIU
DOI
10.1109/DRC.2013.6633799
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84890058060&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/380226
Type
conference paper