High-Resolution Topographic and Isotopic Imaging with a 40 KeV Ga+ Scanning Ion Microprobe
Resource
EMSA-MAS Meeting, Louisville, KY(1985.08)
Microbeam Analysis, 1985, p.209-218
Journal
EMSA-MAS Meeting, Louisville, KY(1985.08)
Pages
-
Date Issued
1985
Date
1985
Author(s)
Wang, Yuh-Lin
Publisher
San Francisco: San Francisco Press
Type
conference paper