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College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Visualize susceptibility information with third harmonic generation microscopy and spectroscopy
Details
Visualize susceptibility information with third harmonic generation microscopy and spectroscopy
Journal
Program and Abstract Book of Focus on Microscopy (FOM 2016)
Date Issued
2016
Author(s)
H.-C. Gao
Y.-C. Chen
C.-M. Lee
C.-K. Sun
CHI-KUANG SUN
孫啟光
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429009
Type
conference paper