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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Nondestructive Characterization of RBSOA of High Power-Bipolar Transistors
Details
Nondestructive Characterization of RBSOA of High Power-Bipolar Transistors
Journal
IEEE Transactions on Aerospace and Electronic System
Journal Volume
AES-22
Journal Issue
2
Pages
138-145
Date Issued
1986-03
Author(s)
M. M. Jovanovic
F. C. Lee
DAN CHEN
DOI
10.1109/TAES.1986.310748
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/325582
SDGs
[SDGs]SDG7
Type
journal article