New Approaches for Analyzing the Spurious-Emission and Radiated-Susceptibility Responses of the RF/Microwave Circuits
Date Issued
2011
Date
2011
Author(s)
Hsieh, Han-Chang
Abstract
In this dissertation, efficient designed platforms, the spurious-emission and radiated-susceptibility simulation models, are proposed for analyzing two important electromagnetic compatibility (EMC) problems associated with the radio-frequency (RF) / microwave circuits.
First, a new approach, that incorporates the two-port formulated analytical field expressions into a commercial circuit solver, is proposed and applied to develop the fast spurious-emission simulation model for characterizing the spurious emissions from RF/microwave circuits. Specifically, the developed model is efficient and quick in estimating the radiated emissions from the microstrip circuit structures, active and passive, with x- and y-directed wire elements on a printed circuit board (PCB).
Next, the radiated-susceptibility simulation model, based on the equivalent- source expressions and circuit solver, is proposed for characterizing the field-influenced responses of the RF/microwave microstrip circuits which are illuminated by the external wave-field. With the merit of short simulation time, the proposed model would be very useful and efficient in characterizing the radiated susceptibility problems associated with the complicated RF/microwave circuits under analog/digital modulation schemes.
Subjects
Electromagnetic Compatibility
Spurious Emission
Radiated Susceptibility
Type
thesis
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