Lump devices mapping between designer's schematic and layout extracted schematic in microwave frequency
Journal
2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
Pages
339-342
Date Issued
2010
Author(s)
Abstract
This paper presents an algorithm that can compare the net-lists between schematic and layout of passive microwave multi-layer circuits. Weight vectors that are related to inductance and capacitance of devices connected to a node are defined for node mapping. However, due to the symmetry of microwave circuits, many possible mapping may be found. We then developed a scoring policy to find the most similar mapping. This checker can help designers to verify layout by comparing the net-list from designer's schematic and net-list extracted from layout. This algorithm can also provide missing and extra devices in net-list to assist designer to allocate layout errors quickly.
Type
conference paper