Machine-learning-based hotspot detection using topological classification and critical feature extraction

Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal Volume

34

Journal Issue

3

Pages

460-470

Date Issued

2015

Author(s)

Yu, Y.-T.

Lin, G.-H.

Jiang, I.H.-R.

Chiang, C.

DOI

10.1109/TCAD.2014.2387858

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/497925

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84923884426&doi=10.1109%2fTCAD.2014.2387858&partnerID=40&md5=058b95f3ff163c089fabaff64c45474b

Type

journal article