Nano–scale One-shot Microscopic Surface Profilometry Employing Two-wavelength Simultaneous Phase Shifting Interferometry
Journal
the 7th International Conference on Photonics and Applications (ICPA-7)
Date Issued
2013
Author(s)
Liang-Chia Chen
Phan Van Tiep
Abraham Mario Tapilouw
Shyh-Tsong Lin
Sheng-Lih Yeh
Pham Hong Tua
Description
Ho Chi Minh city, Vietnam
Type
conference paper