Evaluation of the Use of Portable X-Ray Fluorescence for Work Environment Arsenic Exposure Assessment
Date Issued
2004
Date
2004
Author(s)
Chu, Wan-Tsh
DOI
zh-TW
Abstract
The purpose of this study is to evaluate the validity of portable X-ray fluorescence (PXRF) use in work environment arsenic exposure assessment. Experiment design of the present study consisted of three parts. First of all, in the laboratory work, we chose an appropriate collection media and established standard operation procedure for wipe sampling. Secondly, detection limit and optimal range of quantification for arsenic collected on wipe sample were evaluated. At the same time, the interference of lead on the arsenic determination with PXRF for wipe sample was also examined. The final part was to evaluate the validity of PXRF use for arsenic exposure assessment in work field. There was a high correlation (r2=0.997) between the PXRF readings and the ICP-MS analysis results for arsenic sample dosed of 5.0~5000.0 μg/sample. If the PXRF arsenic readings were corrected by a factor derived from the present study, the adjusted PXRF readings are very close to ICP-MS analysis results, within ±25% of the relative error. Following are the conclusions obtained from the present study: 1. The detection limit for arsenic with PXRF is 4.8μg/sample and the optimal range for arsenic determination is 16.1~5000μg/sample, which could be used as guideline for choosing portable XRF in the work environment arsenic exposure assessment. 2. Arsenic quantification would be positively interfered for sample with lead content in sample. This kind of interference could be adjusted by following equation: MICP-MS-As =-5.04＋1.38MXRF-As－0.16MXRF-Pb＋0.00018MXRF-As×MXRF-Pb （r2=0.996）. 3. In this study, the field wipe samples contained gallium with characteristic radiation Kβ（10.26 Kev）, which was very close to arsenic’s characteristic radiation Kㄐ]10.26 Kev）. Therefore, the quantification of arsenic with PXRF for these field samples might be positively interfered due to the coexistence of gallium. Such an interference could be adjusted by the following equation: （r2=0.981）
log(M ICP-MS-As)= -3.55+ 5.37log(MXRF-As) –1.57log(MXRF-As)2 + 0.18log(MXRF-As)3
Subjects
攜帶式X光螢光分析儀
感應耦合電漿質譜儀
擦拭採樣
砷
鉛
鎵
PXRF
ICP-MS
Wipe sampling
Arsenic
Lead
Gallium
Type
thesis
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