Magnetic properties and microstructure of TbCo/(SiNx/Co)(n) films
Resource
Materials & Design, 31(4), 1734-1736
Journal
Materials & Design
Journal Volume
31
Journal Issue
4
Pages
1734-1736
Date Issued
2010
Date
2010
Author(s)
Abstract
The Tb32Co68/(SiNx/Co)n films (n = 0 - 3) were prepared by magnetron sputtering. The magnetic anisotropy of all Tb32Co68/(SiNx/Co)n films are perpendicular to the film plane. It is found that the saturation magnetization (Ms) and perpendicular coercivity (Hc⊥) of the Tb32Co68/(SiNx/Co)3 film are 263 emu/cm3 and 3592 Oe, respectively. This film appears to be a promising material as a heat-assisted magnetic recording (HAMR) medium. The cross-sectional high resolution transmission electron microscope (HRTEM) images show that the interface roughness between the (SiNx/Co)n layers and TbCo layer increases as n is increased. The rough surface provides more obstacles and pinning sites that hinder the motion of the domain walls at interface between the (SiNx/Co)n layers and TbCo layer. Therefore, the Hc⊥ values are profoundly influenced by the interface roughness. Crown Copyright © 2009.
SDGs
Type
journal article
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