Pump-probe studies of carrier capture processes in semiconductor multiple-quantum-well waveguides
Resource
IEEE Photonics Technology Letters 9 (5): 642-644
Journal
IEEE Photonics Technology Letters
Journal Volume
9
Journal Issue
5
Pages
642-644
Date Issued
1997
Date
1997
Author(s)
Chao, Chung-Yen
Li, Jiun-Haw
Chen, Ming-Ching
Abstract
Carrier capture processes in multiple-quantum-well (MQW) waveguides are monitored using the time-resolved pump-probe technique. With appropriate selections of wavelength and pulse recompression, subpicosecond pulses at various wavelengths can be obtained for both nondegenerate and degenerate pump-probe experiments with various polarization combinations. Two samples of different quantum-well structures are compared. It is found that the carrier capture times (defined as the time period to reach probe transmission maximum after the pump) are in the range from 15 to 50 ps in the samples used. In the degenerate pump-probe measurements, a two-component decay is observed for one of the samples in the case of TM pump and TE probe.
Subjects
Charged carrier processor; Quantum-well devices
SDGs
Other Subjects
Charge carriers; Electron energy levels; Heterojunctions; Light measurement; Light polarization; Optical pumping; Probes; Semiconductor quantum wells; Carrier capture processes; Multiple quantum well (MQW) waveguides; Pump probe studies; Optical waveguides
Type
journal article
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