Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits.

Journal

Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan

Pages

75-80

Date Issued

2009

Author(s)

Shen, Shiue-Tsung

Liu, Wei-Hsiao

Ma, En-Hua

Li, James Chien-Mo

DOI

URI

URL

Type

conference paper