Fast measurement of light scattering spectra from metal nanoparticles based on Fourier transform imaging spectrometry
Date Issued
2008
Date
2008
Author(s)
Lai, Po-Jen
Abstract
In this thesis, we present a novel optical scanning system for rapidly detecting scattering spectra of metal nanoparticles within large field of view on a slide.e constructed a hyperspectral imaging system based on Fourier transform spectrometry. Spectral information was generated by changing optical path difference between two beams in a Michelson interferometer. We utilized charge couple detector to record interference intensity as a function of the optical path difference (interferogram), and calculated the spectra with Fourier transformed the interferogram. By our optical system, we successfully obtained spectral information from white light source with different filters, and scattering spectra from two types of metal nanoparticles on glass slides. The ultimate goal is to apply our optical system to fast scan the scattering spectra of the metal nanoparticles used as optical tags in the microarray. For benchmarking, we compared our results with the multispectral microscopic imaging system built by Dr. Lee’s group at the university of California-Berkeley. Their measuring time of the scattering spectra of metal nanoparticles within the 300 µm x 300 µm field of view is 5 min and ours within the 465 µm x 617 µm field of view is approximately 80 seconds. Compared with Dr. Lee’s group, we have improvable performance in spectral resolution as well as scanning time, and need further effort to get beyond them.
Subjects
Fourier transform spectrometer
Metal nanoparticles
darkfield condenser
scattering spectra
Type
thesis
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