An Analysis of the Anomalous Dip in Scattering Parameter of InGaP–GaAs Heterojunction Bipolar Transistors (HBTs)
Resource
IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 49, NO. 10, OCTOBER 2002
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Journal Volume
VOL. 49
Journal Issue
NO. 10
Pages
-
Date Issued
2002-10
Date
2002-10
Author(s)
DOI
246246/200611150121219
Abstract
The kink phenomenon in scattering parameter of
InGaP–GaAs heterojunction bipolar transistors (HBTs) was explained
quantitatively for the first time. Our results show that the output
impedance of InGaP–GaAs HBTs can be represented by a simple series
resistance–capacitance ( – ) circuit at low frequencies and a simple
parallel – circuit at high frequencies very accurately because of the
high output resistance of HBTs. The behavior of of HBTs is in contrast
with that of field effect transistors (FETs), where the smaller drain–source
output resistance obscures the ambivalent characteristics.
InGaP–GaAs heterojunction bipolar transistors (HBTs) was explained
quantitatively for the first time. Our results show that the output
impedance of InGaP–GaAs HBTs can be represented by a simple series
resistance–capacitance ( – ) circuit at low frequencies and a simple
parallel – circuit at high frequencies very accurately because of the
high output resistance of HBTs. The behavior of of HBTs is in contrast
with that of field effect transistors (FETs), where the smaller drain–source
output resistance obscures the ambivalent characteristics.
Subjects
HBT
InGaP
kink phenomenon
scattering parameter
Publisher
Taipei:National Taiwan University Dept Elect Engn
Type
journal article
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