Influence of process conditions on the ferroelectric characteristics of SrBi2Ta2O9 films prepared by RF magnetron sputtering
Journal
Integrated Ferroelectrics
Journal Volume
31
Journal Issue
1¤ë4¤é
Pages
403/87-412/96
Date Issued
2000
Author(s)
Chen Y.-C.
Abstract
The effects of sputtering conditions on the SrBi2Ta2O9 films deposited via a single-target RF-sputtering process were investigated in this study. It was found that the composition of targets significantly affected the phases and the composition of the deposited films. When the target contained high bismuth content, SrBi2Ta2O9 and a secondary Bi2O3 phase were formed. When the bismuth content in the targets was insufficient, a pyrochlore phase was produced. SEM images revealed that the composition of the targets also affected the surface morphology of the obtained films. When the target-to-substrate distance was increased, bismuth oxide was formed, which resulted in an increase in the leakage current. By optimizing the deposition conditions, the ferroelectric properties of SrBi2Ta2O9 films were improved.
Subjects
Ferroelectric
Pyrochlore
Sputtering
SrBi2Ta2O9
Target
Thin films
Type
conference paper