Test Compression for Neuromorphic Chips

Journal

2024 IEEE European Test Symposium (ETS)

Part Of

Proceedings of the European Test Workshop2024

ISBN (of the container)

979-835034932-0

Date Issued

2024-05-20

Author(s)

Xin-Ping Chen

Hsu-Yu Huang

Chu-Yun Hsiao

Jennifer Shueh-Inn Hu

DOI

URI

Event(s)

29th IEEE European Test Symposium, ETS 2024

Publisher

IEEE

Type

conference paper