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Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Using Machine Learning
Journal
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
Part Of
2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Proceedings 2024
ISBN (of the container)
979-835036034-9
Date Issued
2024-04-22
Author(s)
Yu-Tsung Wu
Zhe-Jia Liang
Chao-Ho Hsieh
Yun-Feng Yang
Yung-Jen Lee
Norman Chang
Ying-Shiun Li
Lang Lin
Event(s)
2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024
Publisher
IEEE
Type
conference paper