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  4. On enduring more data through enabling page rewrite capability on multi-level-cell flash memory
 
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On enduring more data through enabling page rewrite capability on multi-level-cell flash memory

Journal
Proceedings of the ACM Symposium on Applied Computing
Pages
107-115
Date Issued
2022
Author(s)
Chang Y.-M
Ho C.-C
Tsao C.-W
Liao S.-H
Wang W.-C
TEI-WEI KUO  
Chang Y.-H.
DOI
10.1145/3477314.3507088
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85130403873&doi=10.1145%2f3477314.3507088&partnerID=40&md5=f977e391214840c584011887761274e3
https://scholars.lib.ntu.edu.tw/handle/123456789/632318
Abstract
The technology of NAND flash memory grows swiftly in response to the huge and rapidly changing storage market in recent years. Meanwhile, the demand for large amounts of data is also growing at an unprecedented scale. How to store more and more data over flash-based systems in a cost-effective way presents immense pressure and challenges to the system design. This motivates us to propose a breakthrough solution on the existing multi-level-cell flash memories such as TLC, being adopted in the mainstream solid-state drives. More specifically, we propose a durable management design through enabling page rewrite capability and incorporate it with the existing flash translation layer to achieve enduring more data written, even beyond the theoretical limit. Moreover, our management design further considers the adverse effect brought by disturbance, which could usually deteriorate the data correctness. The encouraging results through a series of experiments demonstrate the feasibility and the capability of our design. With the best setting we studied, the total amount of data that can be written into the system could be improved up to 2.14 times the baseline without adding any hardware cost. © 2022 ACM.
Subjects
disturbance; endurance; multi-level-cell; page rewrite
SDGs

[SDGs]SDG11

Other Subjects
Computer aided design; Flash memory; Cost effective; Disturbance; Flash translation layer; Large amounts of data; Multi-level cell flash memory; Multi-level-cell; Multilevels; NAND flash memory; Page rewrite; Theoretical limits; Cost effectiveness
Type
conference paper

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