Investigation of YSZ thin films on silicon wafer and NiO/YSZ deposited by ion beam sputtering deposition (IBSD)
Resource
Key Engineering Materials 336: 1788
Journal
Key Engineering Materials 336:
Journal Issue
1788
Pages
-
Date Issued
2007
Date
2007
Author(s)
Chen, Y. J.
Wei, W.C.J.
Type
journal article