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College of Engineering / 工學院
Chemical Engineering / 化學工程學系
Infrared measurement of undercooling during silicon solidification on bare and Si3N4 coated quartz substrates
Details
Infrared measurement of undercooling during silicon solidification on bare and Si3N4 coated quartz substrates
Journal
Journal of Crystal Growth
Journal Volume
453
Pages
130-137
Date Issued
2016
Author(s)
Yang, C.F.
Tsoutsouva, M.G.
Hsu, H.P.
Lan, C.W.
CHUNG-WEN LAN
DOI
10.1016/j.jcrysgro.2016.08.026
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/444841
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84982258438&doi=10.1016%2fj.jcrysgro.2016.08.026&partnerID=40&md5=5c0ecec547fa6b0ebfc8e13f4100a6fd
SDGs
[SDGs]SDG7
Type
journal article