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  4. Design of a Power-Efficient ARM Processor with a Timing-Error Detection and Correction Mechanism
 
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Design of a Power-Efficient ARM Processor with a Timing-Error Detection and Correction Mechanism

Journal
IEEE International System-on-Chip Conference (SOCC)
Date Issued
2016
Author(s)
S. J. Chen
G. Liu
H. P. Yang
C. H. Luo
W. M. Hwu
SAO-JIE CHEN  
DOI
10.1109/socc.2016.7905471
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429349
Abstract
With the growing popularity of mobile devices, the trend in the field of system-on-chip has shifted from high performance to low power operation. However, traditional design methodology is limited by the design margins reserved for process, voltage and temperature variations. Therefore, a systematic solution that enables real-time timing error detection and correction was proposed to eliminate redundant margins in the design of an ARM microprocessor. A prototype stochastic ARM1136 processor was implemented in TSMC 90nm technology. Two circuit-level techniques, Razor and Surger, are exploited to form a hybrid error detection mechanism by observing both global and local timing information. To enable the deployment of aggressive voltage scaling with hardware-based error tolerance mechanism, we propose an activity-driven optimization flow to reshape the slack distribution based on path-activation probability. The chip achieves a frequency of 250MHz at worst case with 48.82mW power consumption. The overall power overhead of the proposed error tolerance mechanism is about 25% (hold-fixing latches 15.25% plus Razor 10.53%). The energy saving through design margins elimination is 51% (an average of the three corner cases) and a 42.8% saving was measured at the lowest operation voltage. © 2016 IEEE.
Subjects
Error Correction; Error Detection; Error Resilience; Razor; Stochastic Processor; Surger
SDGs

[SDGs]SDG7

Other Subjects
Application specific integrated circuits; ARM processors; Energy conservation; Error correction; Integrated circuit design; Probability distributions; Programmable logic controllers; Random processes; Stochastic systems; System-on-chip; Timing circuits; Voltage scaling; Activation probabilities; Aggressive voltage scaling; Error resilience; Error-detection mechanism; Process , voltage and temperatures; Razor; Stochastic Processor; Surger; Error detection
Type
conference paper

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