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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
International Symposium of VLSI Design, Automation, and Test, VLSI-DAT: Foreword
Details
International Symposium of VLSI Design, Automation, and Test, VLSI-DAT: Foreword
Journal
2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT
Date Issued
2008
Author(s)
Chiueh, T.-D.
Cheng, T.
TZI-DAR CHIUEH
DOI
10.1109/VDAT.2008.4542393
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/502412
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-50649108628&doi=10.1109%2fVDAT.2008.4542393&partnerID=40&md5=d25d4a0646acb79dfb19efaf8978ceef
Type
conference paper