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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Origin of the Transient Current Peaks in MIS Structures Observed During I-V Measurement
Details
Origin of the Transient Current Peaks in MIS Structures Observed During I-V Measurement
Journal
International Electronic Devices and Materials Symposium - IEDMS 2018
Pages
2017-THU-P0202-P005
Date Issued
2018
Author(s)
Y.H.Liu
J.G.Hwu
JENN-GWO HWU
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429114
Type
conference paper