Electron microscopy investigation of structural transformations in tungsten oxide (WO 3) thin films
Journal
physica status solidi (a)
Journal Volume
202
Journal Issue
10
ISSN
1862-6300
1862-6319
Date Issued
2005-07-06
Author(s)
Abstract
The phase transformations in tungsten oxide (WO 3) thin films have been investigated in the temperature range of 30-500°C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO 3 thin films occur in sequence exhibiting various crystal phases above room tem perature in the order: monoclinic → orthorhombic → hexagonal. The crystallographic distortions and tilting of the WO 6 octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO 3.
Subjects
Crystallography
Electron diffraction
Electronic properties
Thin films
Transmission electron microscopy
Tungsten compounds
Crystallographic distortions
Room temperature
Selected area electron diffraction (SAED)
Tungsten oxide
Phase transitions
Publisher
Wiley
Type
journal article