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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Dual-cut graphene transistors with constant-current regions fabricated by the atomic force microscope anode oxidation
Details
Dual-cut graphene transistors with constant-current regions fabricated by the atomic force microscope anode oxidation
Journal
Japanese Journal of Applied Physics
Journal Volume
56
Journal Issue
1
Date Issued
2017
Author(s)
Wu, C.-R.
Dou, K.P.
Wang, C.-H.
Chang, C.-E.
Kaun, C.-C.
Wu, C.-H.
Lin, S.-Y.
CHAO-HSIN WU
DOI
10.7567/JJAP.56.010307
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/505959
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85007454247&doi=10.7567%2fJJAP.56.010307&partnerID=40&md5=789916b810a7e0e83137e1ffde4698f4
Type
journal article